APS » Journals » Phys. Rev. ST Accel. Beams » Volume 5 » Issue 4

Phys. Rev. ST Accel. Beams 5, 042801 (2002)

Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

T. Srinivasan-Rao, M. Amin, V. Castillo, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, A. Stillman, T. Tsang, and L. Kowalski
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