Search Results (8 total)

Knowledge of the three-dimensional structure of a charged particle beam bunch is essential for understanding its evolution and for initializing computer simulations, especially when space charge is involved. This paper presents a novel experimental method for time-sliced mapping of the transverse phase space of a space-charge dominated beam based on tomographic principles. The combination of a high precision tomographic diagnostic with fast imaging screens and a gated camera are used to produce phase-space maps of two beams: one with a parabolic current profile and another with a short perturbation atop a rectangular pulse. The correlations between longitudinal and transverse phase spaces are apparent and their impact on the dynamics is discussed.

High brightness electron accelerators, such as energy recovery linacs (ERL), often have complex particle distributions that can create difficulties in beam transport as well as matching to devices such as wigglers used to generate radiation from the beam. Optical transition radiation (OTR), OTR interferometry (OTRI), and optical diffraction-transition radiation interferometry (ODTRI) have proven to be effective tools for diagnosing both the spatial and angular distributions of charged particle beams. OTRI and ODTRI have been used to measure rms divergences, and optical transverse phase space mapping has been demonstrated using OTRI. In this work we present the results of diagnostic experiments using OTR and optical diffraction radiation conducted at the Jefferson Laboratory’s 115 MeV ERL which show the presence of two separate components within the beam’s spatial and angular distributions. By assuming a correlation between the spatial and angular features, we estimate an rms emittance value for each of the two components.

We have developed a novel method based on vector electromagnetic theory and Schelkunoff’s principles, to calculate the spectral and angular distributions of transition radiation (TR) and diffraction radiation (DR) produced by a charged particle interacting with an arbitrary metallic target. The vector method predicts the polarization and spectral-angular distributions of the radiation at an arbitrary distance from the source, i.e., in both the near and far fields, and in any direction of observation. The radiation fields of TR and DR calculated with the commonly used scalar Huygens model are shown to be limiting forms of those predicted by the vector theory and the regime of validity of the scalar theory is explicitly shown. Calculations of TR and DR done using the vector model are compared to results available in the literature for various limiting cases and for cases of more general interest. Our theory has important applications to the design of TR and DR diagnostics, particularly those utilizing coherent TR and DR to infer the longitudinal bunch size and shape. A new technique to determine the bunch length using the angular distribution of coherent TR or DR is proposed.

We have observed the interference of optical diffraction radiation (ODR) and optical transition radiation (OTR) produced by the interaction of a relativistic electron beam with a micromesh foil and a mirror. The production of forward directed ODR from electrons passing through the holes and wires of the mesh and their separate interactions with backward OTR from the mirror are analyzed with the help of a simulation code. By careful choice of the micromesh properties, mesh-mirror spacing, observation wavelength, and filter band pass, the interference of the ODR produced from the unperturbed electrons passing through the open spaces of the mesh and OTR from the mirror are observable above a broad incoherent background from interaction of the heavily scattered electrons passing through the mesh wires. These interferences (ODTRI) are sensitive to the beam divergence and can be used to directly diagnose this parameter. We compare experimental divergence values obtained using ODTRI, conventional OTRI, for the case when front foil scattering is negligible, and computed values obtained from transport code calculations and multiple screen beam size measurements. We obtain good agreement in all cases.

Optical transition radiation (OTR) has proven to be a versatile and effective diagnostic for measuring the profile, divergence, and emittance of relativistic electron beams with a wide range of parameters. Diagnosis of the divergence of modern high brightness beams is especially well suited to OTR interference (OTRI) techniques, where multiple dielectric or metal foils are used to generate a spatially coherent interference pattern. Theoretical analysis of measured OTR and OTRI patterns allows precise measurement of electron beam emittance characteristics. Here we describe an extension of this technique to allow mapping of divergence characteristics as a function of transverse coordinates within a measured beam. We present the first experimental analysis of the transverse phase space of an electron beam using all optical techniques. Comparing an optically masked portion of the beam to the entire beam, we measure different angular spread and average direction of the particles. Direct measurement of the phase-space ellipse tilt angle has been demonstrated using this optical masking technique.

We present quantifiable images of the angular distributions (AD’s) of parametric x radiation (PXR), and vacuum-ultraviolet transition radiation (vuv TR) from 230 MeV electrons interacting with a silicon crystal. Both AD’s are highly polarized. The vuv TR and optical TR data provide measurements of the beam energy and effective divergence angle. Using these quantities and separately known values of the electronic susceptibility ‖χ₀‖, we show that the measured PXR AD is in good agreement with the predictions of single crystal theory. Our analysis suggests a method to measure ‖χ₀‖ using PXR AD’s.

We have observed up to 8 orders (n) in the spectra of parametric x-radiation (PXR) in the range 5–40 keV, produced by the interaction of a 90 MeV electron beam with mosaic graphite and single silicon crystals. The measured yields and intensity ratios, I(n≥2)/I(n=1), in graphite are not in agreement with the theory of PXR for mosaic crystals. In comparison, the ratios of intensities in silicon are close to the predictions of PXR theory for perfect crystals. The bandwidths of spectral lines measured in both silicon and graphite are in good agreement with theoretical predictions.