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Phys. Rev. ST Accel. Beams 8, 014401 (2005)

Velocity bunching of high-brightness electron beams

S. G. Anderson, P. Musumeci, J. B. Rosenzweig, W. J. Brown, R. J. England, M. Ferrario, J. S. Jacob, M. C. Thompson, G. Travish, A. M. Tremaine, and R. Yoder

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Microscopy and Microanalysis

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2009 (1)

Data for non-APS articles provided by the publisher of the respective journals through CrossRef. Any errors or omissions are the responsibility of the primary publisher.

  1. The Development and Applications of Ultrafast Electron Nanocrystallography
    Chong-Yu Ruan, Yoshie Murooka, Ramani K. Raman, Ryan A. Murdick, Richard J. Worhatch, Aric Pell
    Microscopy and Microanalysis 15 323 (2009)