APS » Journals » Phys. Rev. ST Accel. Beams » Volume 5 » Issue 4
< Previous article | Next article >

Phys. Rev. ST Accel. Beams 5, 042801 (2002)

Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique

T. Srinivasan-Rao, M. Amin, V. Castillo, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, A. Stillman, T. Tsang, and L. Kowalski

Abstract
References
Citing Articles (1)
Download: PDF (229 kB) or gzip'ed PS (250 kB) Export: BibTeX or EndNote (RIS)

1 citing articles found

Show Only APS Citations

Journals

Physical Review Letters (1)

Years

2004 (1)

Data for non-APS articles provided by the publisher of the respective journals through CrossRef. Any errors or omissions are the responsibility of the primary publisher.

  1. Electro-Optic Technique with Improved Time Resolution for Real-Time, Nondestructive, Single-Shot Measurements of Femtosecond Electron Bunch Profiles
    G. Berden, S. P. Jamison, A. M. MacLeod, W. A. Gillespie, B. Redlich, and A. F. van der Meer
    Physical Review Letters 93 114802 (2004)