Phys. Rev. ST Accel. Beams 6, 054701 (2003) [6 pages]

Numerical simulation of the generation of secondary electrons in the High Current Experiment

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P. H. Stoltz *
Tech-X Corporation, 5541 Central Avenue, Suite 135, Boulder, Colorado 80301, USA

M. A. Furman and J.-L. Vay
Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

A. W. Molvik and R. H. Cohen
Lawrence Livermore National Laboratory, Livermore, California 94550, USA

Received 4 April 2003; published 8 May 2003

Electron effects in the High Current Experiment (HCX) are studied via computer simulation. An approximate expression for the secondary electron yield for a potassium ion striking stainless steel is derived and compared with experimental results. This approximate expression has a peak of roughly 55 electrons at normal incidence at an ion energy of 60 MeV. Using an empirical angular dependence, the secondary electron yield is combined with a numerical simulation of the HCX ion beam dynamics to obtain an estimate for the number of secondary electrons expected per ion-wall collision in the HCX. This estimate is that approximately 150–200 electrons per ion collision may result in the HCX.


©2003 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevSTAB.6.054701
DOI: 10.1103/PhysRevSTAB.6.054701
PACS: 34.50.Dy, 52.20.Hv, 52.58.Hm, 79.20.Rf

* Email address: pstoltz@txcorp.com

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