Phys. Rev. ST Accel. Beams 6, 054701 (2003) [6 pages]Numerical simulation of the generation of secondary electrons in the High Current Experiment
P. H. Stoltz *
M. A. Furman and J.-L. Vay
A. W. Molvik and R. H. Cohen Received 4 April 2003; published 8 May 2003 Electron effects in the High Current Experiment (HCX) are studied via computer simulation. An approximate expression for the secondary electron yield for a potassium ion striking stainless steel is derived and compared with experimental results. This approximate expression has a peak of roughly 55 electrons at normal incidence at an ion energy of 60 MeV. Using an empirical angular dependence, the secondary electron yield is combined with a numerical simulation of the HCX ion beam dynamics to obtain an estimate for the number of secondary electrons expected per ion-wall collision in the HCX. This estimate is that approximately 150–200 electrons per ion collision may result in the HCX. ©2003 The American Physical Society
URL: http://link.aps.org/doi/10.1103/PhysRevSTAB.6.054701 * Email address: pstoltz@txcorp.com [ Abstract | Previous article | Next article | Issue 5 ] |
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