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Phys. Rev. ST Accel. Beams 6, 054701 (2003) [6 pages]

Numerical simulation of the generation of secondary electrons in the High Current Experiment

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P. H. Stoltz*
Tech-X Corporation, 5541 Central Avenue, Suite 135, Boulder, Colorado 80301, USA

M. A. Furman and J.-L. Vay
Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

A. W. Molvik and R. H. Cohen
Lawrence Livermore National Laboratory, Livermore, California 94550, USA

Received 4 April 2003; published 8 May 2003

Electron effects in the High Current Experiment (HCX) are studied via computer simulation. An approximate expression for the secondary electron yield for a potassium ion striking stainless steel is derived and compared with experimental results. This approximate expression has a peak of roughly 55 electrons at normal incidence at an ion energy of 60 MeV. Using an empirical angular dependence, the secondary electron yield is combined with a numerical simulation of the HCX ion beam dynamics to obtain an estimate for the number of secondary electrons expected per ion-wall collision in the HCX. This estimate is that approximately 150–200 electrons per ion collision may result in the HCX.

This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI.

© 2003 The American Physical Society

URL:
http://link.aps.org/doi/10.1103/PhysRevSTAB.6.054701
DOI:
10.1103/PhysRevSTAB.6.054701
PACS:
34.50.Dy, 52.20.Hv, 52.58.Hm, 79.20.Rf

*Email address: pstoltz@txcorp.com