Phys. Rev. ST Accel. Beams 6, 014201 (2003) [7 pages]

Image-charge effects on the envelope dynamics of an unbunched intense charged-particle beam

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B. L. Qian *, J. Zhou, and C. Chen
Plasma Science and Fusion Center, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139

Received 5 August 2002; published 6 January 2003

The root-mean-squared (rms) envelope equations are derived and analyzed for an unbunched intense charged-particle beam in an alternating-gradient focusing field and a cylindrical conducting pipe. All higher-order image-charge effects from the cylindrical pipe are expressed in terms of so-called multiple moment factors in the rms beam envelope equations, and the multiple moment factors are evaluated. Numerical results show that for vacuum phase advance σv<90, the image-charge effects on the matched and slightly mismatched beam envelopes are negligibly small, at all orders, for all beams with arbitrary beam density profiles (including hollow density profiles) as well as for arbitrary small apertures (including beams with large aspect ratios). However, the main unstable region for the envelope evolution with image-charge effects, which occurs for 90v<270, depending on the value of the normalized beam intensity SK/ε, is found to be narrower than its counterpart without image-charge effects.


©2003 The American Physical Society

URL: http://link.aps.org/doi/10.1103/PhysRevSTAB.6.014201
DOI: 10.1103/PhysRevSTAB.6.014201
PACS: 41.85.Ja, 41.75.–i

* Permanent address: Department of Applied Physics, National University of Defense Technology, Changsha 410073, Hunan, People’s Republic of China.

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