Phys. Rev. ST Accel. Beams 5, 042801 (2002) [7 pages]Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique
T. Srinivasan-Rao, M. Amin, V. Castillo, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, A. Stillman, and T. Tsang
L. Kowalski Received 1 December 2001; published 22 April 2002 A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established. ©2002 The American Physical Society
URL: http://link.aps.org/doi/10.1103/PhysRevSTAB.5.042801 [ Abstract | Previous article | Next article | Issue 4 ] |
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