Phys. Rev. ST Accel. Beams 5, 042801 (2002) [7 pages]Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique |
PRL Celebrates 50 Years
This Week's Milestone Letters are from 1974: |
T. Srinivasan-Rao, M. Amin, V. Castillo, D. M. Lazarus, D. Nikas, C. Ozben, Y. K. Semertzidis, A. Stillman, and T. Tsang
Brookhaven National Laboratory, Upton, New York 11973
L. Kowalski
Montclair State University, Upper Montclair, New Jersey 07043
Received 1 December 2001; published 22 April 2002
A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established.
©2002 The American Physical Society
URL: http://link.aps.org/abstract/PRSTAB/v5/e042801
DOI: 10.1103/PhysRevSTAB.5.042801
PACS: 41.85.Ew, 07.60.-j, 07.77.Ka
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