Phys. Rev. ST Accel. Beams 5, 042801 (2002) [7 pages]Novel single shot scheme to measure submillimeter electron bunch lengths using electro-optic technique
A novel, single shot, nondestructive scheme to measure the bunch length of submillimeter relativistic electron bunches using the electro-optical method is described. In this scheme, the birefringence induced by the electric field of the electrons converts the temporal characteristics of the bunch to a spatial intensity distribution of an optical pulse. Electric field characteristics, induced birefringence, and retardation are calculated for a few typical electron beam parameters and criteria limiting the resolution are established. This article is available under the terms of the Creative Commons Attribution 3.0 License. Further distribution of this work must maintain attribution to the author(s) and the published article’s title, journal citation, and DOI. © 2002 The American Physical Society URL:
http://link.aps.org/doi/10.1103/PhysRevSTAB.5.042801
DOI:
10.1103/PhysRevSTAB.5.042801
PACS:
41.85.Ew, 07.60.-j, 07.77.Ka
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